Posts Tagged ‘Accellera’
Thursday, October 16th, 2014
I spent Tuesday of this week in the Winchester Mystery House, San Jose’s best-known tourist attraction, hearing a wide variety of opinions about design IP, verification IP (VIP), the Internet of Things (IoT), and related topics. “Unlock the Mystery of IP: Silicon Valley IP Users Conference” was organized and presented by IPextreme and their Constellations program partners. I found most of the talks quite interesting, and would like to share some thoughts on what the experts’ projections might mean for Breker and our customers.
There is no doubt that the increasing use of IP is key to designing ever larger chips. Kands Manickam of IPextreme noted that, over the next five years, the compound annual growth rate (CAGR) of IP blocks and subsystems is expected to be 12% versus 3.5% for semiconductors. Randy Smith of Sonics reported that the average large chip today has about 120 blocks, growing to more than 200 by 2018. We already know that VIP reuse is not as effective as design IP reuse, and these projections will only exacerbate the gap.
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Tags: Accellera, Breker, DV, ESL, functional verification, IoT, IP, IPextreme, portable stimulus, SoC, SoC verification, uvm, VIP 2 Comments »
Wednesday, October 8th, 2014
Last week we summarized some of the activities at the inaugural DVCon India. Breker was not the only company impressed by this show. For example, CVC wrote two posts on their VerifNews blog describing the excitement and range of technical content at the show. Gaurav Jalan captured several aspects of the show in his Sid’dha-karana blog, focusing specifically on the keynote speakers. The Agnisys blog also provided a nice overview. Clearly this was a very successful event.
The high quality of the technical content and the excellent attendance at DVCon lead me to think about how much India has changed in just a few years. I first had an engineering team there in 1995, nearly 20 years ago. I recall my first trip to India very well and the contrast with recent visits is tremendous. I’ve been deeply impressed by the evolution of electronics development in India and I see the DVCon success as both a tribute to where the community is today and a sign of even better things to come.
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Tags: Accellera, Bangalore, Breker, chennai, DV, dvcon, ESL, functional verification, India, madras, portable stimulus, SoC, SoC verification, uvm No Comments »
Friday, October 3rd, 2014
Over the last several blogs posts, we’ve twice previewed the very first DVCon India show, celebrating it as a sign of India’s ever-growing importance in the electronics industry. We also mentioned that our co-founder and CEO Adnan Hamid would be presenting in two tutorials and helping to staff our booth in the exhibition. Now that the event is over and Adnan has returned from his travels, we’d like to fill you in what turned out to be a great event.
We have heard nothing but positive comments from attendees, vendors, and organizers. The conference was well attended, full of strong technical content, and well run. Perhaps the dominant theme to emerge was the importance of the “portable stimulus” effort undertaken by Accellera and the solutions available to meet some or all of the vision. It may be a stretch to call DVCon India the “Portable Stimulus Conference” but surely the first day (Thursday) was “Portable Stimulus Day” and we’ll explain why.
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Tags: Accellera, Bangalore, Breker, Cadence, CVC, DV, dvcon, ESL, functional verification, India, mentor, portable stimulus, Synopsys, uvm No Comments »
Tuesday, September 9th, 2014
What verification engineer doesn’t love the occasional conference? It’s a chance to get out of the cubicle farm, hang out with colleagues from other companies, listen to stimulating technical talks, and catch up on what EDA, IP, and semiconductor vendors have been doing. Even in a time of tight travel budgets, the right conference can provide dividends far beyond its cost. There are a lot of smart people in the electronics industry and it’s valuable to share problems and solutions with them.
There are actually quite a few conferences and trade shows that have interesting verification content and draw significant numbers of verification engineers. One of the most-read posts in the history of The Breker Trekker blog was a discussion on which conferences verification engineers like best. We are constantly evaluating which events provide the most value to us and our customers, and find ourselves in the unusual position of having four shows scheduled in four locations over the next four weeks.
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Tags: Accellera, apps, ARM, austin, Bangalore, Boston, Breker, Cadence, coherency, CVC, DV, dvcon, ESL, functional verification, India, mentor, Newton, portable stimulus, Santa Clara, SNUG, Synopsys, TechCon, TrekSoC, TrekSoC-Si, TrekUVM, uvm No Comments »
Friday, August 29th, 2014
As anyone involved in chip development knows, one of the biggest events of the year is the Design and Verification Conference and Exhibition, DVCon, which has been held for many years in San Jose. I’ve frequently shared my thoughts on this show and its importance to the industry in this blog. In just four weeks, DVCon expands to Bangalore for the very first DVCon India show. The full program for September 25-26 is now online and I’d like to focus on a few highlights from my perspective.
The first thing to note is the breadth of material being covered. The technical track is split between electronic system level (ESL) and design and verification (DV) topics, with a slight edge to the latter in terms of overall sessions. There are as many as five tracks in parallel, which is quite an accomplishment for a brand-new event. I know that there were many excellent session proposals submitted, which means that those selected are likely to be of high quality and wide interest.
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Tags: Accellera, Bangalore, Breker, Cadence, CVC, DV, dvcon, ESL, functional verification, India, mentor, portable stimulus, Synopsys, uvm 1 Comment »
Wednesday, July 30th, 2014
In our previous two posts, we went into considerable detail on the vertical reuse of verification information from IP block to subsystem to system. We have focused on how graph-based scenario models enable simple composition as you move up the design hierarchy. This type of reuse is not possible with traditional testbench elements such as UVM scoreboards and virtual sequencers. Once again, this is not a slam against the UVM, but rather a basic trait of constrained-random testbenches.
We skimmed over one aspect of vertical reuse: the transition from a “headless” SoC subsystem with no CPU to full-chip simulation with our automatically generated multi-threaded C test cases running on the SoC”s embedded processors. We also skipped the question of whether or not our graph-based scenario models can generate full-chip tests for chips that do not contain processors and are not classified as SoCs. This post links these ideas together and answers the question. (more…)
Tags: Accellera, Breker, coverage, EDA, functional verification, graph, portable stimulus, pwg, reuse, scenario model, scoreboard, sequencer, SoC verification, standards, UVC, uvm, working group No Comments »
Tuesday, July 22nd, 2014
In our last post, we went into quite a detailed discussion of how the Accellera Universal Verification Methodology (UVM) has limitations on reuse. Specifically, we showed why it is not possible to compose scoreboards and virtual sequencers together as you move up the design hierarchy from verifying blocks to verifying clusters or complete chips. In the process, information about how connected blocks communicate is lost and must be recreated in the higher-level sequencer.
We also claimed that graph-based scenario models provide more effective reuse, specifically because lower-level graphs can be composed into a higher-level graph as blocks are combined and you move up the chip hierarchy vertically. Block-level graphs compose cluster-level graphs, and cluster-level graphs compose full-chip graphs. In today’s post, we take the same example used last time and show how reuse works with graph-based scenario models rather than pure UVM testbenches.
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Tags: Accellera, Breker, coverage, EDA, functional verification, graph, portable stimulus, pwg, reuse, scenario model, scoreboard, sequencer, SoC verification, standards, UVC, uvm, working group 2 Comments »
Thursday, July 17th, 2014
Over the lifetime of The Breker Trekker, we’ve published numerous posts about the inherent benefits of graph-based scenario models for verification. These models allow you to pull on a rope rather than push it. They allow you to begin with the end in mind, solving backwards to determine the necessary inputs. They support advanced verification planning and debug. They make verification modeling more pleasant. They enable both horizontal reuse over the course of a project and vertical reuse from IP block to subsystem to system.
Today we’d like to dig into a particular aspect of vertical reuse that we have not addressed in detail before. One of the goals of verification standards has been to define testbench elements that are reusable. This goal was very much in mind when the Accellera working group standardized the Universal Verification Methodology (UVM). By establishing a standard architecture, nomenclature, and application programming interface (API), UVM components are highly reusable from project to project and even company to company. However, the UVM fails at other forms of reuse.
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Tags: Accellera, Breker, coverage, EDA, functional verification, graph, portable stimulus, pwg, reuse, scenario model, scoreboard, sequencer, SoC verification, standards, UVC, uvm, working group 1 Comment »
Tuesday, July 8th, 2014
Last week we talked once again about our familiar mantra to “begin with the end in mind” when performing SoC verification. We described the enormous value that graph-based scenario models provide by enabling automatic test case generation from desired results. TrekSoC can walk the graph backwards, from result to inputs, and generate the C code necessary to exercise true user-level test cases across multiple threads and multiple heterogenous processors.
It’s clear even to the biggest fans of the Universal Verification Methodology (UVM) that this standard breaks down at the full-chip level for an SoC containing one or more embedded processors. The UVM, for all its good points, does not encompass code executing on processors and does not provide any guidance on how to link such code with the testbench that connects the chip’s inputs and outputs. The value of scenario models for SoCs is clear. But what about large chips without embedded processors? Does Breker have a role to play there as well?
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Tags: Accellera, assertions, Breker, coverage, EDA, formal, functional verification, graph, portable stimulus, pwg, reuse, scenario model, SoC verification, standards, test generation, working group No Comments »
Monday, June 30th, 2014
I’ve written about formal analysis rather frequently in this blog, although I do not consider Breker’s products to be formal in nature. There are several reasons for this. After ten years working with formal tools, I remain personally interested in that market. I also see interesting parallels between the adoption of formal and graph-based technologies. Further, whenever we cover formal analysis we get a great response. Clearly our readers like the topic as well.
I’m returning to formal this week because of a provocative comment made by one of our customers at DAC a few weeks ago. Wolfgang Roesner from IBM participated on the show floor in a Pavilion Panel called “The Asymptote of Verification.” Among several astute observations about the attributes of graph-based scenario models, he made a comparison with formal analysis that I found especially perceptive.
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Tags: Accellera, assertions, Breker, coverage, EDA, formal, functional verification, graph, mentor, portable stimulus, pwg, reuse, scenario model, SoC verification, standards, test generation, working group No Comments »
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