Posts Tagged ‘os-vvm’
Monday, January 29th, 2018
 In this blog, my major focus is on explaining the concepts such as Sequence, Sequencer, Driver and showing how the communication takes place from sequence to sequencer and from sequencer to driver. In the previous blog, I included a top-level diagram of the UVM structure, showing different base classes. If you need refresh your memory on where the classes Sequence, Sequencer and Drivers stand please click https://www.aldec.com/en/company/blog/149–understanding-the-inner-workings-of-uvm.
So, let’s look at the main concepts and follow the communication mechanism they use for the effective execution of a test.
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Tags: asic, co-simulation, coverage, debugging, documentation, FPGA, os-vvm, Riviera-PRO, uvm, verification
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Tuesday, September 24th, 2013
 Jim Lewis, VHDL Training Expert at SynthWorks (and founding member of OSVVM, which Aldec was an early adopter of) was kind enough to author a guest blog for Aldec. Here’s an excerpt:
After presenting a conference paper on how to do OSVVM-style constrained random and intelligent coverage (randomization based on functional coverage holes), I received a great question, “Why Randomize?”
The easiest way to answer this is with an example. Let’s look at a FIFO test – test a FIFO, write to it, read from it, write to it and read from it simultaneously, fill it and see that additional writes are held off successfully, and empty it and see that additional reads are held off successfully.
Most certainly a FIFO can be tested using a directed test (just code, no randomization). The following simulation waveform shows diffcount (the number of words in the FIFO) for a directed test. The lowest value is empty. The highest is full. Using this, you can visually check off all of the required conditions and see that the FIFO is indeed tested.
For the rest of this article, visit the Aldec Design and Verification Blog.
Tags: Aldec, coverage, fifo test, functional coverage holes, intelligent coverage, os-vvm, osvvm-style constrained random, randomization, systemverilog, VHDL, vhdl testbench techniques
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Wednesday, August 28th, 2013
 As the proud Product Manager of Aldec’s FPGA Design Simulation solution, I am excited (like it was my first Cranberries concert) to announce that Active-HDL™ is celebrating 16 years since its initial release in 1997. Active-HDL has not merely stood the test of time, it has dominated the FPGA market like a Hulk Hogan smackdown with powerful simulation performance and debugging tools.
The key to Active-HDL’s long-term success lies in Aldec’s customer-centric philosophy. Simply put, we really do listen closely to our users and invest heavily in our tools. For this reason, continued simulation performance optimizations from release to release enable users to benefit from Active-HDL’s faster simulation even as the size of FPGA designs continues to grow.
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Tags: Active-HDL, Aldec, assertions, cen, chinese electronics news, co-simulation, coverage, debugging, debugging tools, design, digital, documentation, FPGA, fpga design simulation solution, fpga designs, HDL, ieee, matlab, os-vvm, project management, semiconductor industry, simulation, simulation platform, standards, top fpga design, university, verification, verification platform, verilog, VHDL, Xilinx
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In this blog, my major focus is on explaining the concepts such as Sequence, Sequencer, Driver and showing how the communication takes place from sequence to sequencer and from sequencer to driver. In the previous blog, I included a top-level diagram of the UVM structure, showing different base classes. If you need refresh your memory on where the classes Sequence, Sequencer and Drivers stand please click https://www.aldec.com/en/company/blog/149–understanding-the-inner-workings-of-uvm.
