Posts Tagged ‘Santa Clara’
Thursday, March 26th, 2015
As we discussed in last week’s post, the past two days we were busy with activities at SNUG Silicon Valley, the annual focus for all things Synopsys. On Monday we exhibited in the Designer Community Expo, which drew programmers, architects, and verification engineers in addition to hardware designers. We have always been impressed by the verification teams we meet at SNUG. They’re all working on hard projects and open to new ideas that will help them find more bugs more quickly.
We also had the pleasure of speaking for the first time in the SNUG technical program, with a talk on “Integration of Portable Test Cases and System-Level Coverage with Verdi HW SW Debug Using VC Apps” in the VC Apps Developer Forum session yesterday. We had a nice response from the 65 or so attendees and were delighted with their interest. Since the talks in this session do not have corresponding papers in the SNUG Proceedings, we’d like to use today’s post to fill in the technical details.
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Tags: Accellera, Breker, DCE, debug, design IP, EDA, functional verification, graph, graph-based, HW SW, portable stimulus, Santa Clara, scenario model, simulation, SNUG, SoC verification, test generation, Universal Verification Methodology, uvm, VC Apps, VCS, Verdi, verification IP, VIP No Comments »
Wednesday, March 18th, 2015
Following a very successful DVCon in San Jose two weeks ago, next week we travel a few miles up the road to the Santa Clara Convention Center for the Synopsys Users Group (SNUG) Silicon Valley event. This will be our third year in a row exhibiting at this show, and it has become one of our favorites. We will also be speaking for the first time ever, and we’ll fill in all the details shortly. But let’s start by looking at why this show stands out and why we enjoy it so much.
SNUG actually has quite an interesting history. It began in 1991 as a way for Synopsys users to discuss common problems and solutions, meet with technical experts from the company’s R&D and AE teams, and learn about new products and features. Unlike many single-vendor conferences, SNUG has been driven largely by the users. They choose the papers to be presented and make many of the key decisions on how the event is run. Synopsys of course provides support in many ways.
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Tags: Accellera, Breker, DCE, debug, design IP, EDA, functional verification, graph, graph-based, HW SW, portable stimulus, Santa Clara, scenario model, simulation, SNUG, SoC verification, test generation, Universal Verification Methodology, uvm, VC Apps, VCS, Verdi, verification IP, VIP No Comments »
Tuesday, September 9th, 2014
What verification engineer doesn’t love the occasional conference? It’s a chance to get out of the cubicle farm, hang out with colleagues from other companies, listen to stimulating technical talks, and catch up on what EDA, IP, and semiconductor vendors have been doing. Even in a time of tight travel budgets, the right conference can provide dividends far beyond its cost. There are a lot of smart people in the electronics industry and it’s valuable to share problems and solutions with them.
There are actually quite a few conferences and trade shows that have interesting verification content and draw significant numbers of verification engineers. One of the most-read posts in the history of The Breker Trekker blog was a discussion on which conferences verification engineers like best. We are constantly evaluating which events provide the most value to us and our customers, and find ourselves in the unusual position of having four shows scheduled in four locations over the next four weeks.
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Tags: Accellera, apps, ARM, austin, Bangalore, Boston, Breker, Cadence, coherency, CVC, DV, dvcon, ESL, functional verification, India, mentor, Newton, portable stimulus, Santa Clara, SNUG, Synopsys, TechCon, TrekSoC, TrekSoC-Si, TrekUVM, uvm No Comments »
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