Posts Tagged ‘graph’
Tuesday, October 15th, 2013
All of us at Breker are excited as we write this post, since we’ve just made our most important product announcement in several years. We’ve expanded the Breker product line by adding TrekSoC-Si, a brand-new tool that generates multi-threaded, multi-processor, self-verifying C test cases for in-circuit emulation (ICE), FPGA-based prototypes, and actual production silicon. In other words, TrekSoC-Si does for hardware platforms what TrekSoC did for simulation.
We’ll talk more about how TrekSoC-Si works in a moment. But first it’s important to note that both TrekSoC and TrekSoC-Si use the same graph-based scenario models as input to describe the intended behavior of the SoC and provide a test plan. This means that, for the first time in the industry, you can achieve horizontal verification reuse across your entire project schedule, from high-level simulation models all the way through your first chips arriving from the foundry.
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Tags: Breker, EDA, functional verification, graph, reuse, scenario model, SoC verification, Trek, TrekSoC, TrekSoC-Si, verification IP, VIP No Comments »
Tuesday, September 10th, 2013
In our last technical blog post, we surveyed some of the existing forms of coverage, including their virtues and limitations, and their applicability to SoC designs. We also introduced a new type of metric, system coverage, based on application scenarios that reflect how an end user would actually run applications on the SoC. We closed by claiming that “Breker’s graph-based scenario models are ideal for establishing, measuring, and refining system coverage.” This is the next in a series of posts to explain why and how.
Another earlier post described the Breker approach of “beginning with the end in mind” using graph-based scenario models. In the graphs used by TrekSoC, outcomes appear on the left and inputs appear on the right, reflecting the way that the test case generator works from the desired result toward the setup conditions needed for a particular application scenario.
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Tags: Breker, functional verification, graph, scenario model, SoC verification, system coverage, test generation, TrekSoC No Comments »
Monday, August 19th, 2013
No SoC verification engineer worthy of the title would argue that coverage is unimportant. Even back in the 1980s, before commercial coverage tools and industry standards were available, leading ASIC teams manually added coverage code into their testbenches. They checked that key state machines visited all legal states or made all legal transitions, or that a processor executed all opcodes in its instruction set, over the course of a simulation test.
Verification teams who ignored coverage in those days were at risk of letting bugs slip through to silicon. The old maxim “if you don’t verify it, it’s broken” summed the situation up well. Today, leading SoC teams have adopted system coverage. Those who are ignoring this aspect of coverage are at risk of letting serious system-level bugs slip through. Let’s talk about system coverage and why it’s different from other metrics in use today.
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Tags: Breker, code coverage, concurrency, coverage, functional coverage, functional verification, graph, scenario model, SoC verification, system coverage, TrekSoC 2 Comments »
Tuesday, July 23rd, 2013
Folks who have been following Breker for a while know that we like the phrase “begin with the end in mind.” It succinctly summarizes why our use of graph-based scenario models is different than traditional constrained-random testbenches.
Suppose that you want to trigger a particular behavior within your design as part of your verification process. With a testbench, you have control over only the design’s inputs, so you might issue a series of input stimulus changes that you believe will cause the desired behavior. You may hit your target, or you may not. Automating your testbench with the constrained-random capabilities of the Universal Verification Methodology (UVM) reduces the manual effort, but there’s still no guarantee that you will trigger your targeted behavior.
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Tags: Breker, constrained-random, EDA, functional verification, graph, scenario model, test generation, TrekSoC, uvm No Comments »
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