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Posts Tagged ‘UVM’

DVCon Europe: European Practicality With International Relevance

Friday, October 30th, 2015

On November 11th and 12th, DVCon Europe will once again take place in the lovely city of Munich. The inaugural event last year demonstrated a clear need for this event in Europe, with a focus on practical information that allowed the attendees to get a rapid, all-encompassing update on a broad range of design and verification techniques. Furthermore, it also showed the international audience those areas where Europe leads, influencing EDA development and thinking on a global basis.

This year’s show promises an even bigger and better program. It is expected to grow significantly, and indeed, early registrations, the size of the exhibit, and the number of papers and tutorials all bear this out. The theme of the conference, focused on the predominantly European automotive semiconductor segment, acts as a driver for next-generation design and verification across the entire industry, given the absolute reliability requirements of these devices. Subject areas, including system-level abstraction, analog/mixed-signal devices, UVM and other advanced verification, will all be discussed during a number of networking opportunities including a Gala dinner, included as part of the registration.
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