The electronic system design ecosystem feted Design-for-Test expert Dr. Tom Williams at a well-attended Phil Kaufman Award dinner & ceremony November 7 hosted by the ESD Alliance and IEEE CEDA.

Here are two photos capturing the mood of the evening. More will be available soon.

Tom Williams (far left) with the Phil Kaufman Award statuette. With him are Shishpal Rawat (at right) and me (Bob Smith).

Prior Kaufman Award recipient Aart de Geus from Synopsys.