Posts Tagged ‘reuse’
Monday, March 10th, 2014
In our last two posts, we talked about the 2014 edition of the Design & Verification Conference & Exhibition, DVCon, in San Jose. Now that the show is history, lots of bloggers are summarizing their experience. Since I thought that this was an excellent event all around, allow me to join the chorus of voices praising DVCon 2014.
Here at Breker, our biggest effort goes toward the exhibition. Although it’s a relatively small booth and exhibit floor, we do want to put our best foot forward. So we had all-new signage this year updating attendees on our products and their capabilities. We also showed a very different demo from last year, with our TrekSoC-Si product generating a test case, downloading it into a commercial SoC (a TI OMAP4430), and running in the actual chip. We chose to repeat our very popular giveaway from DAC: a combined flashlight and distress whistle that will come in handy if you perform inadequate SoC verification and hit an iceberg.
(more…)
Tags: Breker, Cadence, dvcon, EDA, emulation, functional verification, graph, mentor, reuse, scenario model, simulation, SoC verification, test generation, TrekSoC-Si
No Comments »
Tuesday, February 18th, 2014
In our last post, we discussed the results of a survey by Wilson Research Group and Mentor Graphics. Among other interesting statistics, we learned that verification engineers spend 36% of their time on debug. This seems consistent with both previous surveys and general industry wisdom. As SoC designs get larger and more complex, the verification effort grows much faster than the design effort. The term “verification gap” seems to be on the lips of just about every industry observer and analyst.
We noted that debug can be separated into three categories: hardware, software, and infrastructure. Hardware debug involves tracking down an error in the design, usually in the RTL code. Software debug is needed when a coding mistake in production software prevents proper function. Verification infrastructure–testbenches and models of all kinds–may also contain bugs that need to be diagnosed and fixed. As promised, this post discusses some of the ways that Breker can help in all three areas.
(more…)
Tags: Breker, constrained-random, EDA, functional verification, graph, IP, reuse, scenario model, simulation, SoC verification, TrekSoC, TrekSoC-Si, use cases, uvm
No Comments »
Tuesday, February 4th, 2014
Our last post on the relationship between the Universal Verification Methodology (UVM) and Breker’s technology was very popular. In only a week, it has become the fifth-most-read post in the nine-month history of The Breker Trekker blog. Clearly people are interested in the UVM and what strengths and weaknesses it brings to the ever more complex world of SoC verification.
This week we’d like to continue the discussion with a topic that we did not address last week: how the UVM offers an alternative to running embedded code by replacing one or more of the processors in the SoC with a verification component (VC). Our CEO, Adnan Hamid, addressed this topic in an Electronic Design article last November. We’d like to revisit some of the key points of that article in the context of last week’s UVM discussion
(more…)
Tags: Breker, EDA, emulation, functional verification, reuse, scenario model, simulation, SoC verification, system coverage, test generation, TrekSoC, TrekSoC-Si, UVC, uvm, verification component, verification IP, VIP
No Comments »
Tuesday, January 28th, 2014
When people first start reading about Breker and what we do, we make the point that transactional simulation testbenches are breaking down at the full-SoC level. Usually, we specifically mention the Universal Verification Methodology (UVM) standard from Accellera as not being up to the challenge of full-chip verification for SoC designs. We sometimes worry that someone will read into this that we don’t like the UVM, or Accellera, or even standards in general. Nothing could be further from the truth!
We have great respect for the UVM and other EDA-related standards developed by Accellera, IEEE, and other organizations. In this post, we’d like to discuss specifically what we see as the strengths and weaknesses of the UVM and explain how Breker’s technology complements rather than replaces this methodology. Yes, the UVM has limitations, and we address those with our tools and technologies. But the UVM forms a stable and standard base on which nearly all of our customers build their simulation-based verification environments.
(more…)
Tags: Breker, constrained-random, EDA, emulation, functional verification, graph, reuse, scenario model, sequencer, simulation, SoC verification, system coverage, test generation, TrekSoC, TrekSoC-Si, Universal Verification Methodology, uvm, VIP, virtual sequencer
No Comments »
Monday, December 30th, 2013
Please allow me to start this post with a sincere wish for all of our readers to have a happy and healthy holiday season. There are many enjoyable activities both sacred and secular this time of year, something for everyone whatever your personal beliefs. I hope that you all have the chance to relax a bit and share some delicious food with family and friends.
I thought about writing a column on the top 5 holiday wishes for verification engineers, but I felt that it would be a bit presumptuous to speak for you. We do work very hard to understand what you need in order to tailor our products to gaps in your verification process and speed up your project. Therefore, I’m going to offer 5 gifts for you, the verification engineer, that are available with Breker’s products. I hope that you like them!
(more…)
Tags: applications, Breker, EDA, emulation, functional verification, graph, production software, reuse, scenario model, simulation, SoC verification, system coverage, test generation, TrekSoC, TrekSoC-Si, use cases, uvm, verification IP, VIP
No Comments »
Tuesday, October 15th, 2013
All of us at Breker are excited as we write this post, since we’ve just made our most important product announcement in several years. We’ve expanded the Breker product line by adding TrekSoC-Si, a brand-new tool that generates multi-threaded, multi-processor, self-verifying C test cases for in-circuit emulation (ICE), FPGA-based prototypes, and actual production silicon. In other words, TrekSoC-Si does for hardware platforms what TrekSoC did for simulation.
We’ll talk more about how TrekSoC-Si works in a moment. But first it’s important to note that both TrekSoC and TrekSoC-Si use the same graph-based scenario models as input to describe the intended behavior of the SoC and provide a test plan. This means that, for the first time in the industry, you can achieve horizontal verification reuse across your entire project schedule, from high-level simulation models all the way through your first chips arriving from the foundry.
(more…)
Tags: Breker, EDA, functional verification, graph, reuse, scenario model, SoC verification, Trek, TrekSoC, TrekSoC-Si, verification IP, VIP
No Comments »
Tuesday, October 8th, 2013
One of the curious aspects of electronics is that most products are specified from the top down but implemented and verified from the bottom up. This is true for system-on-chip (SoC) development as well. As the onset, someone in product marketing specifies a chip that has a specific collection of functionality to meet a specific customer need. The architecture team develops a block diagram that defines the subsystems and perhaps some individual IP blocks as well.
When it comes time to develop the RTL that implements the SoC, designers tend to work from the IP blocks upward. They select commercial IP where it makes sense and develop unique IP when needed. Designers are usually responsible for verifying their own blocks, perhaps with some assistance from verification engineers. There is usually minimal verification of commercial IP unless it has been customized for the SoC project.
(more…)
Tags: Breker, functional verification, integration verification, IP, reuse, scenario model, SoC verification, subsystem, use cases, verification IP, vertical, VIP
No Comments »
|
