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Posts Tagged ‘28nm’

Guest Post: DAC From a Different Perspective

Monday, June 16th, 2014

We hope you enjoyed last week’s guest post from Jonah McLeod of Kilopass with his experiences at this year’s Design Automation Conference (DAC) in San Francisco. We’ve offered several of our friends in the EDA industry to write in with their assessments of the show. Next up is Lauro Rizzatti, another industry veteran perhaps best-known as general manager of EVE-USA. These days he’s a verification consultant, and he shares his story of going to DAC as a conference attendee rather than as a vendor:

This is the first DAC where I wasn’t responsible for an exhibitor booth and it was exhilarating. I was able to attend sessions, walk the exhibit floor and, generally, get a feel for what’s going on in our industry. I’m pleased to report the news is good. Very good, in fact.

(more…)




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