Tom Williams is an impressive photographer. Don’t rely on my say so –– check out his website at: https://bit.ly/2Anv3zl
Dr. Thomas W. Williams, this year’s recipient of the Phil Kaufman Award.
That’s not why the selection committee from the ESD Alliance and IEEE CEDA chose him to be the recipient of the 2018 Phil Kaufman Award for Distinguished Contributions to Electronic System Design, however. Tom was selected because he is an extraordinary technologist in an industry composed of an exceptional number of extraordinary technologists.
Tom took an overlooked design area now known as Design for Testability and revolutionized chip testing, a significant and lasting achievement. Efficiently testing today’s chips would not be possible without his scan test techniques that both created a revenue stream for EDA suppliers and saved chip companies many millions of dollars over the last 40 years.
I’m looking forward to Tom Williams’ acceptance speech Wednesday, November 7, at The GlassHouse in San Jose. While he’s certain to talk about DFT, his slide presentation will include many of his striking photographs. The evening will be memorable and will include great food and plenty of networking. It starts at 6:30 p.m. Please join us. Attendance is open to member companies, though attendees don’t need to be members to attend. Registration information can be found at: http://bit.ly/2MwQdCN. Sponsorships for the evening are available as well. Julie Rogers, our director of marketing and operations, (jrogers@semi.org) has details.
