Bridging the Frontier Bob Smith, Executive Director
Bob Smith is Executive Director of the ESD Alliance responsible for its management and operations. Previously, Bob was senior vice president of Marketing and Business Development at Uniquify, responsible for brand development, positioning, strategy and business development activities. Bob began his … More » Phil Kaufman Award Dinner for Dr. Tom Williams Will Offer Good Cheer, Stories, Travel PhotosOctober 9th, 2018 by Bob Smith, Executive Director
Anyone who read the recent profile of Dr. Thomas W. Williams by Cadence’s Paul McLellan knows attendees at the upcoming Phil Kaufman Award Ceremony and Dinner honoring Dr. Williams are in for a treat. This year’s award recipient was kicked out of school in the third grade, became an Eastern US figure skating champion as a teenager and goes each fall to Hudson Bay to photograph polar bears. Oh, and he invented scan test, the reason why the ESD Alliance, a SEMI Strategic Association Partner, and the IEEE Council on Electronic Design Automation (CEDA) are feting him. With a background as diverse and unique as Dr. Williams’, the dinner and award ceremony is certain to be filled with plenty of good cheer, stories and travel photos. Great food is a given because it will be held at The GlassHouse in San Jose. Please join us Wednesday, November 7, at 6 p.m. for a memorable evening. Attendance is open to member companies at a substantial discount. Of course, you don’t need to be a member to attend. Registration information can be found at: http://bit.ly/2MwQdCN. Sponsorships for the evening are available as well. Julie Rogers, our director of marketing and operations, (jrogers@semi.org) has details. Dr. Williams, who retired from Synopsys as a Synopsys Fellow in 2009, resides in Canmore, Alberta, Canada. Formerly, he was with the IBM Microelectronics Division and managed the VLSI Design for Testability group. Dr. Williams is known for the seminal paper co-authored with Dr. Ed Eichelberger describing Level Sensitive Scan Design (LSSD) presented at DAC in 1977. Since then, the concept has been adopted by major digital electronics manufacturers and EDA companies. He continued to enhance these and other Design-for-Testability techniques, laying the foundation for testing modern integrated circuits and systems. The Phil Kaufman Award is our industry’s more prestigious award and honors individuals who have had a demonstrable impact on the field of electronic system design through technology innovations, education/mentoring, or business or industry leadership. The award was established as a tribute to the late Phil Kaufman (1942-1992), an industry pioneer who turned innovative technologies into commercial businesses that have benefited electronic designers. Last year’s recipient was Dr. Rob A. Rutenbar, senior vice chancellor for Research at the University of Pittsburgh, recognized for his pioneering contributions to algorithms and tools for analog and mixed-signal designs. You or your company is welcome to join the ESD Alliance, SEMI’s newest Strategic Association Partner. Your voice is welcome as we address technical, marketing, economic and legislative issues affecting the electronic system design ecosystem and promote its value as a vital component of the global electronics industry. Please visit the ESD Alliance website to read about our committees and other ongoing initiatives, including last week’s Digital Marketing Workshop 2.0, an informative evening where attendees had plenty of time to network with each other. Photos of the event can be found at: https://bit.ly/2LLg4S9 I’m always available to answer questions about the ESD Alliance and can be reached at bsmith@semi.org Follow the ESD Alliance: Website: www.esd-alliance.org ESD Alliance Bridging the Frontier blog: http://bit.ly/2oJUVzl Twitter: @ESDAlliance LinkedIn: https://www.linkedin.com/groups/8424092 Facebook: https://www.facebook.com/ESDAlliance |