EL SEGUNDO, Calif. – Jan. 8, 2018 AWR/NI announcement:
Ultra-high frequency (UHF) radio-frequency identification (RFID) technology is being adopted by a variety of applications such as inventory control tracking, race timing, attendee tracking, access control, and more. A significant challenge for RF/microwave designers is performance degradation of UHF RFIDs due to RF interference. Prof. Wang-Sang Lee and his team at Gyeongsang National University in Korea used NI AWR Design Environment, specifically Visual System Simulator™ (VSS) system design software, to consider the electromagnetic interference (EMI) effects of an RFID signal and to analyze the impact of RF interference in a passive UHF RFID system. “VSS is easy to use and provides detailed descriptions of each element, which helped us to quickly and easily analyze the RFID system,” said Professor Lee. “The many useful VSS examples related to recent RF system simulations available through the knowledgebase were very helpful, as was the responsive technical support.”
Where: The complete success story can be found at awrcorp.com/customer-stories/gyeongsangnational-university-gnu.
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Vice President of Marketing, AWR Group, NI