Dec 17, 2017 - The event is taking place this Thursday, 14th December at the Santa Clara Convention Center so why not come and meet us at booth 26 and discuss in person how your advanced node System on Chip (SoC) programme can benefit from Moortec's high performance In-Chip Monitoring Subsystem Solutions.
The annual conference and trade show is designed to bring together the semiconductor IP supply chain and its customers for a full day of everything to do with semiconductor IP.
This year an even greater diversity of suppliers will be promoting their products in a fair and balanced showcase. REUSE 2017 will also provide an open forum for communication and networking within the industry.
Moortec offer a range of 'off the shelf' silicon proven monitoring IP on 40nm, 28nm & FinFET. Moortec have also recently announced the availability of their easy to integrate, embedded subsystem on 7nm. Within the subsystem the new 7nm Temperature Sensor is a high precision low power junction temperature sensor that has been developed to be embedded into ASIC designs. It can be used for a number of different applications including Dynamic Frequency and Voltage Scaling (DVFS), device lifetime enhancement, device characterisation and thermal profiling.
In addition, the new 7nm Process Monitor provides the means for advanced node Integrated Circuit (IC) developers to detect the process variation of 7nm core digital MOS devices. The Process Monitor can be used to enable continuous DVFS optimisation systems, monitor manufacturing variability across chip, gate delay measurements, critical path analysis, critical voltage analysis and also monitor silicon ‘ageing’.
The subsystem also includes the sophisticated Process, Voltage and Temperature (PVT) Controller with AMBA APB interfacing, which supports multiple monitor instances, statistics gathering, a production test access port as well as other compelling features.
Along with our offering we can provide expertise on macro placement, production results, support and guidance on how to implement DVFS/AVS optimisation schemes and reliability schemes. As a big growth area for advanced technology design, Moortec are able to help our customers understand more about architecting and implementing such schemes. Being the only PVT dedicated IP vendor, Moortec is now considered a centre-point for such expertise.
Moortec PVT monitoring IP is designed to optimise performance in today’s cutting edge technologies, solving the problems that come about through scaling of devices towards 28nm, FinFET and 7nm. Applications include Datacentre & Enterprise, Automotive, Mobile, IoT, Consumer (DTV) and Telecommunications.
If you are working on advanced node technologies it is highly likely that your SoC will require monitoring to enhance real-time performance optimisation and lifetime reliability. Understanding how the chip has been made (process) as well as understanding its dynamic conditions (voltage supply and junction temperature) has become a critical requirement for advanced node semiconductor design.
Established in 2005, Moortec provide in-chip monitors and sensors, such as embedded Process Monitors (P), Voltage Monitors (V) and Temperature Sensors (T). Moortec’s PVT monitoring IP products enhance the performance and reliability of today’s Integrated Circuit (silicon chip) designs. Having a track record of delivery to tier-1 semiconductor and product companies, Moortec provide a quick and efficient path to market for customer products and innovations.
If you would like to arrange a meeting at the event, please contact Ramsay Allen on +44 1752 875133 or Email Contact
For more information please visit www.moortec.com