Author: Matthew Hogan
A shift-left strategy to tackle the complexities of power domain leakage in IC design
Managing leakage power is a critical challenge for IC designers, as it can profoundly impact a device’s power, performance, area (PPA) and overall reliability. Leakage can manifest in various ways, from analog gate leakage causing high current drain to digital gate leakage leading to power management and reliability issues. Even subtle circuit changes can introduce leakage problems that compromise the final product. Traditionally, designers have left verification of these leakage issues until later design stages, resulting in costly rework. However, a shift-left approach that integrates leakage and reliability analysis into the pre-layout phase can help identify and address potential problems early on. By leveraging advanced EDA tools that take a holistic view of the circuit, designers can get ahead of leakage challenges and ensure their ICs meet the highest standards of quality and reliability.
