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Posts Tagged ‘built-in self test’

OS-VVM CoveragePkg, A Detailed Example

Thursday, May 15th, 2014

Alex Grove, FirstEDA Applications Specialist, was kind enough to author a guest blog for Aldec. Here’s an excerpt:

Here in Europe, I recently had the opportunity to work with Jim Lewis, OS-VVM Chief Architect and IEEE 1076 Working Group Chair, on the first Advanced VHDL Testbenches & Verification training course. This training, held in Bracknell, UK, was attended by engineers from several major European system companies who design and verify programmable devices (FPGAs). VHDL is by far the dominate language used by Europe’s system companies for the design and verification of FPGAs, however it is unclear to many how to enhance their verification with VHDL. What I have found is that experienced FPGA design engineers (including myself) are not utilising the VHDL language for verification.

Jim Lewis introduces VHDL’s verification capabilities, including new VHDL 2008 features and the Open Source VHDL Verification Methodology (OSVVM). OSVVM provides a methodology for testbench development and verification packages that provide functional coverage and random value generation. (more…)




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