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08/05/06 04:10 PM
Good Concept - Reveals a huge gap Report this article as Inappropriate to us !!!Login to Reply

The said rule format should be defined by IEEE as a standard, as should the process profile itself. Given such a standardized process description, there are quite a number of benefits. As noted, automatic DRC runset generation is a direct result. There may also be automatic RCX techfiles for various parasitics extraction tools. Which leads one to think, well, if I can define the process, the layers, the electrical behaviours, then why not throw in the device model parameters? Given all that, you can do some serious data mining. That is, keep track of your device failures (i.e. DRC yeild related), then PCA correlate back to the database. Anyway .. we are doing basically this ...

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SubjectPosted byPosted on
*Automatic Environment for DRC Rule File Development and QA  07/06/06 03:56 AM
.*Sometime this is to be startedRamesh.Nadamuni  09/07/06 11:53 PM
.*Great Idea - But how feasible would it beDave  08/22/06 12:05 AM
.*Good Concept - Reveals a huge gapMatt  08/05/06 04:10 PM
.*Address a true needTarek Badreldin  07/19/06 06:34 PM
.*Interesting article, but what is the means to it?Ahmed Yehia  07/10/06 01:51 PM
.*Good articleAiteen Zhang  07/09/06 04:58 AM
.*Good work but we need moreMohamed Ismail  07/06/06 03:56 AM
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