Videos -> 2016 IPC/Apex


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Peter van den Eijnden, Managing Director
JTAG Technologies
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Keywords: Peter van den Eijnden, JTAG Technologies, EDA, IPC, APEX, fault coverage, diagnostics, board test, jtag functional test, system on chip test, test
Description: Sanjay Gangal interviews Peter van den Eijnden, Managing Director of JTAG Technologies at 2016 IPC/APEX Expo.






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