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Title : Guidelines for Chip Design For Test (DFT)
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Date : 09-Feb-2007
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In this 4-part document, we will look at DFT guidelines specific to the design of boards to be tested through the boundary-scan registers of IEEE 1149.1-compliant devices. Since the 1149.1 structures are incorporated inside the compliant devices, many of the guidelines relate to the specification of optional features inside the devices i.e. are device-level DFT guidelines. Accordingly, the first part of the document considers the device-level guidelines.
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Interested in DFT - rachna - Report As Inappropriate
This is the guidelines for DFT - DFT - Report As Inappropriate
i need to see it first.. - Jay - Report As Inappropriate
thanks for the design for test doc - dft - Report As Inappropriate


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