DFT Microsystems Strengthens Executive Team

MONTREAL, Oct. 15 /PRNewswire/ - DFT Microsystems, Inc. ("DFT"), announced today the appointment of industry veteran, Ken Skala, as Vice President, Marketing.

"We're extremely delighted that Ken has chosen to join DFT at this very exciting time for our company." says David Lisk President and CEO of DFT "His extensive knowledge and proven experience in all aspects of the semiconductor test industry will provide the impetus we need to ensure success in achieving our growth targets."

Ken is a seasoned and highly respected semiconductor test industry veteran. Prior to DFT, Ken spent more than 5 years at Credence Systems where he was responsible for product architecture, development and initial product marketing for the award winning Diamond test platform. Prior to Credence, Ken founded Kinetix Microsystems delivering custom semiconductors and system level test solutions to major companies such as, Maxim, Xilinx, LSI Logic, Teradyne, Credence and Megatest. Under Ken's leadership, Kinetix grew to $11M in annual sales. Ken co-authored seven US patents and is a BSEE graduate of Massachusetts Institute of Technology (MIT).

"I'm thrilled to be joining DFT at this moment in time" says Skala. "The semiconductor test industry is going through a dramatic change brought on by the new business dynamics of lower cost consumer electronic products. DFT is uniquely positioned to exploit this change through volume deployment of its high performance, low-cost test technology. I'm very enthusiastic about the prospects for the company and appreciate the opportunity to help the team ensure success."


DFT Microsystems, Inc delivers a breakthrough in semiconductor test cost and performance via miniature, high throughput, mixed-signal and high-speed digital test products. By delivering state of the art performance and signal processing capabilities within its test modules, DFT Microsystems' technology extends the capabilities and economic life of any ATE platform. Our semiconductor test solutions dramatically reduce test cost and accelerate time-to-volume.

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