LTX Introduces Fusion EX - the New Benchmark for SOC Test Scalability; Reducing The Cost of Test for Complex, High Volume ICs

WESTWOOD, Mass.—(BUSINESS WIRE)—June 20, 2005— LTX Corporation (Nasdaq: LTXX), a leading supplier of semiconductor test solutions, today announced its new Fusion EX. This new Fusion configuration offers four times as many instrument channels as the popular Fusion CX, a new functional/structural digital test channel, and Fusion's proven mixed-signal instruments. Fusion EX meets the emerging needs for cost-effective testing of highly complex, high-volume integrated circuits, such as advanced consumer-digital and baseband communications devices. Key to its ability to test these types of devices in parallel is its high number of instrument slots, which also enable massive multisite testing of lower complexity devices.

Fusion EX is fully outsource-manufactured, and has been ordered by several customers, with multiple units already delivered.

"After successfully launching Fusion, the industry's first single-platform SOC tester several years ago, we listened to our customers and heard them loud and clear - single-platform testers were their future but one-size doesn't fit every application," commented Roger W. Blethen, chairman and chief executive officer of LTX. "Today we announced Fusion EX, our fourth in a series of second generation, scalable Fusion systems. Based on its quick acceptance by several customers, including IDMs and fabless IC companies, Fusion EX seems to have hit the mark."


Fusion EX incorporates 80 universal instrument slots, enabling a wider range of system configurations. Fusion EX also uses existing Fusion platform instruments, which are architected with a limited number of instrument channels per card to provide small configuration increments. This instrument channel granularity, combined with Fusion's universal slot design, produces system configurations with a lower cost of ownership than competitive platforms.

Fusion EX provides full functional test capabilities and the built-in support necessary for effective structural test, including:

-- Full featured digital performance up to 200MHz, including embedded memory test, and time measurement per pin

-- Proven SERDES options to 12Gb/s

-- Design for test (DFT) support through independent scan per pin

-- Seamless interface to third-party built-in self test (BIST) solutions with fully integrated diagnostic support

In addition, Fusion EX utilizes the same, proven mixed signal instrument set as the Fusion CX and Fusion DX configurations, including multiple synthesizers and digitizers, and a full suite of DC and power test options.

Fusion EX also provides program compatibility utilizing LTX's established enVision device oriented programming environment. Used across the Fusion platform, enVision provides powerful debug tools, encapsulation of test objects for easy reuse of test intellectual property, and transparent multisite to reduce the cost of test.


As a second generation Fusion system, Fusion EX offers unprecedented reliability. LTX has developed a comprehensive, custom support package for Fusion EX, which takes advantage of the system's built-in reliability and LTX customer support expertise to maximize system uptime and performance while minimizing operational costs.


LTX Corporation (Nasdaq: LTXX) is a leading supplier of test solutions for the global semiconductor industry. Fusion, LTX's patented, scalable, single-platform test system, uses innovative technology to provide high performance, cost-effective testing of system-on-a-chip, mixed signal, RF, digital and analog integrated circuits. Fusion addresses semiconductor manufacturers' economic and performance requirements today, while enabling their technology roadmap of tomorrow. LTX's web site is

LTX and Fusion are registered trademarks and enVision is a trademark of LTX Corporation.

All other trademarks are the property of their respective owners.

LTX Corporation
Mark Gallenberger, 781-467-5417

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