Solido Design to Present Seminar at DATE Exploring Variation Robustness for Analog, Custom Digital and Memory Design

SANTA CLARA, Calif.—(BUSINESS WIRE)—March 5, 2008— Solido Design Automation, innovator of process variation solutions for transistor-level designers of analog/mixed-signal, custom digital and memory integrated circuits, today announced that the company will present a technical seminar on "Variation Robustness for Analog/Mixed-Signal, Custom Digital and Memory Design" at the Design Automation and Test Europe (DATE) Conference being held on March 10 - 14, 2008 at the ICM in Munich, Germany.
WHO:     Patrick Drennan, Chief Technology Officer, Solido Design

WHAT:    This seminar will include a review of the physical phenomena
          and industry standard device models for variation sources,
          including random local and global variations and systematic
          proximity effects. New techniques to accelerate, increase
          accuracy and derive more information from statistical
          variation analysis will also be presented.

WHERE:   2008 DATE Conference, Munich, Germany
         At the ICM in room 2156

WHEN:    9:00 a.m. - 10:00 a.m. CET, March 12th
         Continental breakfast will be served

To register go to:

About Solido Design Automation

Solido Design Automation Inc. provides process variation solutions for transistor-level designers of analog/mixed-signal, custom digital, and memory integrated circuits. The privately held company is venture capital funded and has offices in U.S.A., Canada, Japan and Europe. For further information, visit or call 306-382-4100.


PR for Solido Design Automation:
Michelle Clancy, 252-940-0981
Email Contact


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