LogicVision to Demonstrate 6.2Gbps High Speed SerDes Test Solution at 43rd Design Automation Conference

SAN JOSE, Calif., July 18 /PRNewswire-FirstCall/ -- LogicVision, Inc. (NASDAQ: LGVN), a leading provider of test and yield learning capabilities, announced today that it will demonstrate its embedded test technology, ETSerdes, for testing high-speed SerDes, scaling to 6.2Gbps and beyond. With ETSerdes customers can cut overall test cost by up to 50% by eliminating the need to upgrade to expensive high speed test equipments and reducing device time on the tester. This capability and other LogicVision Embedded Test solutions will be demonstrated at Booth 1528 at the 43rd Design Automation Conference in San Francisco, July 24-27, 2006.

With the rapid adoption of high-speed I/O devices in consumer and industrial applications and the rising cost of high-speed test equipments, device manufactures need cost-effective solutions that ensure high coverage tests with minimal impact and investment in new production infrastructure.

"At Ample Communications we have considered a number of alternatives, but believe that LogicVision's ETSerdes has the matching capability we need to guarantee the performance of our high-speed I/O interfaces," said Manuel Yuen VP Operations. "Being able to perform a full set of SerDes tests at production speeds is the key to ensure our products meet our shipped product quality level (SPQL) goal." Ample Communications is a leading supplier of high-speed Ethernet and SONET silicon for enterprise and metropolitan area network equipment OEMs.

As a purely digital implementation, ETSerdes has no impact on the SerDes core performance, and does not require any design or test calibration. Automated test insertion and comprehensive diagnostic and characterization software tools accelerate silicon bring-up from months to days, while its sub-picosecond, highly repeatable results allow tighter guard-bands resulting in higher wafer yields. Additionally because the ETSerdes is embedded in the device, it can be controlled and configured on any test equipment.

Using the LogicVision's unique Unlimited Time Resolution Analysis (ULTRA) methodology, ETSerdes can test any SerDes device, at any speed, with any number of lanes, on any tester. LogicVision will demonstrate ETSerdes performing a full set of high-speed I/O parametric tests at production test speeds. These tests include at-speed waveform tests, transmit jitter and distortion tests, and receive jitter and distortion tolerance tests. All tests are performed at sub-picosecond measurement levels and in a few hundred milliseconds.

ETSerdes also supports "Test-to-Go," an embedded suite of precision tests that are available at wafer, package, board and system test. This offers a critical advantage when optimizing high-speed I/O channels on boards and through backplanes.

Availability

ETSerdes is currently in customer use and available immediately for customer adoption. To schedule a demonstration of ETSerdes at the Design Automation Conference, please visit http://www.logicvision.com.

About LogicVision, Inc.

LogicVision, Inc. provides unique yield learning capabilities in the design for manufacturing space. These capabilities enable its customers, leading semiconductor companies, to more quickly and efficiently learn to improve product yields. The company's advanced Design for Test (DFT) product line, ETCreate, works together with ETAccess and SiVision yield learning applications to improve profit margins by reducing device field returns, reducing test costs, and accelerating both time to market and time to yield. LogicVision solutions are used in the development of semiconductor ICs for products ranging from digital consumer goods to wireless communications devices and satellite systems. LogicVision was founded in 1992 and is headquartered in San Jose, Calif. For more information visit http://www.logicvision.com.

Forward Looking Statements

Except for the historical information contained herein, the matters set forth in this press release, including statements as to the expected features and benefits of and cost reductions from the use of the ETSerdes product, are forward-looking statements within the meaning of the Private Securities Litigation Reform Act of 1995. These forward-looking statements are subject to risks and uncertainties that could cause actual results to differ materially, including, but not limited to, the impact of competing products and technological advances, the risk that the expected benefits of and cost reductions from adopting LogicVision's products and technology are not realized, and other risks detailed in LogicVision's Form 10-Q for the quarter ended March 30, 2006, and from time to time in LogicVision's SEC reports. These forward-looking statements speak only as of the date hereof. LogicVision disclaims any obligation to update these forward-looking statements.

Web site: http://www.logicvision.com/




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