A Noise-Driven Effective Capacitance Method With Fast Embedded Noise Rule Calculation for Functional Noise Analysis - Technical Paper from DAC 2005

Texas Instruments

Panel talk from Terry Doherty, Peter McShane, Suhas A. Pai, Sriram Sundararajan, Soo-Kwan Eo, and Pascal Urard.

Electronic System-Level design has arrived - but can ESL provide the bridge from systems to silicon? Comprised of real world designers, this DAC ESL panel will examine and debate what works, what doesn’t, and what the gaps are in the methodology and tool offerings. Panelists from a variety of industry segments, including Military/aerospace, storage area networks (SAN), wireless communications and consumer electronics, will share their experiences, lessons learned and further needs.


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