Keithley University Offers Free Tutorial Webcasts

CLEVELAND — (BUSINESS WIRE) — March 2, 2011Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, announces “Keithley University,” a series of tutorial webcasts that cover best practices for making even the most demanding measurements. Access to Keithley University is available free at:

The web seminars available through Keithley University include:

  • Understanding the Basics of Electrical Measurements
    Many people need to make electrical measurements but are not necessarily experts in measurement science. In this seminar, scientists or engineers who need to perform electrical measurements but who have little experience can learn how to go about choosing test equipment, designing a test system, or simply carrying out measurements using existing equipment.
  • How to Get the Most from Your Low Current Measurement Instruments
    This seminar covers the basics of low current (from nanoamps to femtoamps) electrical measurements, including how to select the right current measurement instrument, practical ways to reduce current noise in measurement setups, and how to quantify subtle sources of error. These measurement best practices are important for applications in semiconductor material/device characterization, nanotechnology test and measurement, optoelectronic device characterization, and many more. Examples of applications requiring such sensitive measurements are presented, as is an overview of recent test equipment innovations.
  • Tips, Tricks, and Traps of Semiconductor Capacitance-Voltage ( C-V) Testing
    This seminar is designed to help laboratory engineers implement, troubleshoot, and verify C-V measurement systems. The seminar discusses the keys to getting good C-V measurement results. Topics include system setup and results from some extended C-V applications, such as high voltage C-V and quasistatic C-V.
  • Tips, Tricks, and Traps in Ultra-Fast I-V Semiconductor Characterization
    Learn how to implement, troubleshoot, and verify pulsed I-V, transient I-V, and general-purpose Ultra-Fast I-V measurement systems. The seminar provides the keys to getting good measurements. Topics discussed include system setup, typical measurement limitations, and results from some actual devices.
  • Hall Effect Measurements Fundamentals
    Those who attend this seminar will learn how Hall effect measurement systems are commonly used to determine semiconductor parameters, such as carrier mobility and carrier concentration, Hall coefficient, and conductivity and conductivity type.

For More Information
To learn more about Keithley University, visit To learn more about Keithley, contact the company at:

            Telephone:       888-534-8453
FAX: 440-248-6168

Email Contact


Address: Keithley Instruments, Inc.
28775 Aurora Road
Cleveland, OH 44139-1891

1 | 2  Next Page »

Review Article Be the first to review this article
CST Webinar Series


Featured Video
Manager, Field Applications Engineering for Real Intent at Sunnyvale, CA
Electronics Firmware / Digital DesignEngineer 2 for Northrop Grumman at Rolling Meadows,, IL
Upcoming Events
SEMICON Europe at Grenoble France - Oct 25 - 27, 2016
ARM TechCon 2016 at Santa Clara Convention Center Santa Clara CA - Oct 25 - 27, 2016
Call For Proposals Now Open! at Santa Clara Convention Center, Santa Clara, CA California CA - Oct 25 - 27, 2016
DeviceWerx - 2016 at Green Valley Ranch Casino & Resort Las Vegas NV - Nov 3 - 4, 2016
S2C: FPGA Base prototyping- Download white paper

Internet Business Systems © 2016 Internet Business Systems, Inc.
595 Millich Dr., Suite 216, Campbell, CA 95008
+1 (408)-337-6870 — Contact Us, or visit our other sites:
AECCafe - Architectural Design and Engineering TechJobsCafe - Technical Jobs and Resumes GISCafe - Geographical Information Services  MCADCafe - Mechanical Design and Engineering ShareCG - Share Computer Graphic (CG) Animation, 3D Art and 3D Models
  Privacy Policy