DAC Knowledge Center - May 13

DAC.com Knowledge Center

Message from the Editor

Seven new articles are now live at the DAC.com Knowledge Center. 

The Wednesday keynote speaker, Dr. Bernard Meyerson, is an IBM Fellow; he presently serves as the Vice President for Innovation, and leader of IBM's Global University Relations Function, within IBM's Corporate HQ organization. Gabe Moretti's discussion with Dr. Meyerson is now in the Knowledge Center.  New are two viewpoints, one on how EDA developers' imagination contributes to successful tool development, and one on IP vendor requirements (from the winner of the recent EDN Innovation Award for Silicon Intellectual Property). Two white papers address the Open SystemC Initiative's AMS modeling standard and how design teams can get started with static verification.  A technical article from Mentor and STMicroelectronics shows the potential of new links between diagnosis and yield learning. Finally, authors from Global Unichip preview their 2010 User Track presentation on a timing budgeting flow for SiP co-design. 

General topics

From Prediction to Realization: Creativity in EDA
By Gabe Moretti
 
Tested and Tried: The Right Way to Evaluate Your IP Vendor  
By Ed Bard  
 

 
front end design topics

Getting Started With Static Verification  
By Ping Yeung, Ph.D.
 
SystemC AMS Extensions: Solving the Need for Speed
By Martin Barnasconi
 
Imagining Verification Success  
By Rajiv Kumar
 

 
back end design topics

Leveraging Diagnosis for Yield Analysis
By Geir Eide, Davide Appello
 
A Precise Timing Budgeting Flow for SiP Co-design
By Tsung-Ying Tsai, Shi-Hao Chen, Yi-Feng Chen
 
 
 
DAC Highlights




 

 

DAC.com Knowledge Center

Message from the Editor

Seven new articles are now live at the DAC.com Knowledge Center. 

The Wednesday keynote speaker, Dr. Bernard Meyerson, is an IBM Fellow; he presently serves as the Vice President for Innovation, and leader of IBM's Global University Relations Function, within IBM's Corporate HQ organization. Gabe Moretti's discussion with Dr. Meyerson is now in the Knowledge Center.  New are two viewpoints, one on how EDA developers' imagination contributes to successful tool development, and one on IP vendor requirements (from the winner of the recent EDN Innovation Award for Silicon Intellectual Property). Two white papers address the Open SystemC Initiative's AMS modeling standard and how design teams can get started with static verification.  A technical article from Mentor and STMicroelectronics shows the potential of new links between diagnosis and yield learning. Finally, authors from Global Unichip preview their 2010 User Track presentation on a timing budgeting flow for SiP co-design. 

General topics

From Prediction to Realization: Creativity in EDA
By Gabe Moretti
 
Tested and Tried: The Right Way to Evaluate Your IP Vendor  
By Ed Bard  
 

 
front end design topics

Getting Started With Static Verification  
By Ping Yeung, Ph.D.
 
SystemC AMS Extensions: Solving the Need for Speed
By Martin Barnasconi
 
Imagining Verification Success  
By Rajiv Kumar
 

 
back end design topics

Leveraging Diagnosis for Yield Analysis
By Geir Eide, Davide Appello
 
A Precise Timing Budgeting Flow for SiP Co-design
By Tsung-Ying Tsai, Shi-Hao Chen, Yi-Feng Chen
 
 
 
DAC Highlights



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