Seven new articles are now live at the DAC.com Knowledge Center.
The Wednesday keynote speaker, Dr. Bernard Meyerson, is an IBM Fellow; he presently serves as the Vice President for Innovation, and leader of IBM's Global University Relations Function, within IBM's Corporate HQ organization. Gabe Moretti's discussion with Dr. Meyerson is now in the Knowledge Center. New are two viewpoints, one on how EDA developers' imagination contributes to successful tool development, and one on IP vendor requirements (from the winner of the recent EDN Innovation Award for Silicon Intellectual Property). Two white papers address the Open SystemC Initiative's AMS modeling standard and how design teams can get started with static verification. A technical article from Mentor and STMicroelectronics shows the potential of new links between diagnosis and yield learning. Finally, authors from Global Unichip preview their 2010 User Track presentation on a timing budgeting flow for SiP co-design.