The Book 'Signal Integrity Characterization Techniques' Focuses on Real-World Applications of Signal Integrity Measurements

DUBLIN, Ireland—(BUSINESS WIRE)—November 4, 2008— Research and Markets ( has announced the addition of the "Signal Integrity Characterization Techniques" report to their offering.

"Signal Integrity Characterization Techniques" addresses the gap between traditional digital and microwave curricula all while focusing on a practical and intuitive understanding of signal integrity effects within the data transmission channel. High-speed interconnects such as connectors, PCBs, cables, IC packages, and backplanes are critical elements of differential channels that must be designed using today's most powerful analysis and characterization tools. Both measurements and simulation must be done on the device under test, and both activities must yield data that correlates with each other. Most of this book focuses on real-world applications of signal integrity measurementsfrom backplane for design challenges to error correction techniques to jitter measurement technologies. The authors' approach wisely addresses some of these new high-speed technologies, and it also provides valuable insight into its future direction and will teach the reader valuable lessons on the industry.

Companies Mentioned:

- AdMOS Advanced Modeling

- Aeluros

- Agilent Technologies

- Altanova Corporation

- Altera

- Amalfi Semiconductor


- Bogatin Enterprises, LLC

- CST of America, Inc.

- Delphi Connection Systems

- ERNI Electroapparate GmbH

- GigaTest Labs

- Harbor Electronics

- Infineon

- JDS Uniphase

- Molex

- National Semiconductor


- Packard Hughes Interconnect

- Redwire Enterprises

- SiliconPipe

- Taconic

- TDA Systems

- Tektronix

- Teradyne

- Tyco Electronics

- Verigy

- Xilinx

For more information visit

Contact: Research and Markets Laura Wood Senior Manager Email Contact Fax from USA: 646-607-1907 Fax from rest of the world: +353-1-481-1716

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