The STDF Fail Data Standardization Group is an informal industry standards working group made up of representatives from automatic test equipment (ATE) suppliers, electronic design automation (EDA) tool vendors and leading semiconductor manufacturers to collaborate on a standard data format for sharing of structural fail information for yield analysis. The standard will benefit anyone who uses semiconductor test results and all interested parties are welcome to join the group. Interested industry members who would like to participate in establishing this standard are invited to contact Ajay Khoche at +1 408.864.5123 or Email Contact. More information is available at http://stdf.bcsweb.com.
Jana Knezovich, +1-408-864-5987