Knights Technology and Cadence Collaborate to Address Yield Ramp Challenges

Proven Interoperability of Knights Merlin and YieldManager with Encounter Diagnostics Accelerates Failure Analysis for Mutual Customers

SUNNYVALE, Calif., Nov. 7 /PRNewswire/ -- Knights Technology today announced a collaborative program with Cadence Design Systems, Inc. (NASDAQ: CDNS) and the validated interoperability of its Camelot(TM) and YieldManager(TM) software with the Cadence(R) Encounter(R) Diagnostics solution. Customers of both companies face shrinking process geometries and immense demands to ramp product yields quickly. The Knights and Cadence collaboration will enable design and manufacturing personnel to better utilize yield diagnostic and fab data to identify and resolve yield excursions.

A leading semiconductor manufacturer is serving as the initial catalyst for the collaboration and is helping the companies define specific areas where yield diagnostic data from Encounter Diagnostics can be quickly passed to Camelot to more easily perform Physical Failure Analysis (PFA). Additionally, results from yield diagnostics can be further analyzed by YieldManager to help improve yields in the fab.

"Collaborating with Cadence is a great step forward in bringing design and manufacturing closer and helping to solve our customers' most pressing yield ramp problems," said David Campbell, vice-president and general manager of Knights Technology. "Building bridges between Encounter Diagnostics and our yield solutions opens new avenues to better utilize existing data and analysis, enabling our shared customers to get products to market faster."

"Knights is a great partner. It has not only superior technology, but a strong presence in many of the leading fabs worldwide," commented Sanjiv Taneja vice president of R&D for Encounter Test at Cadence. "We look forward to bringing our mutual customers high-value solutions that help them achieve faster yield ramp on their nanometer products."

About Knights Technology

Knights Technology, a wholly owned, independently-operated subsidiary of FEI Company, Hillsboro, Oregon, provides software tools to access and extract inspection and measurement results for powerful, fast, and robust yield enhancement analysis in the deep-submicron wafer fab. Further information is available at .

CONTACT: Barbara Swisher of Knights Technology, +1-530-271-1115, or
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