PDF Solutions and Synopsys Extend Liberty Library Format for Yield Optimization with IC Compiler; Delivering Faster Time-to-Results and Better Quality-of-Results for Yield-Driven Optimizations
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PDF Solutions and Synopsys Extend Liberty Library Format for Yield Optimization with IC Compiler; Delivering Faster Time-to-Results and Better Quality-of-Results for Yield-Driven Optimizations

SAN JOSE, Calif.—(BUSINESS WIRE)—June 7, 2005— PDF Solutions(R), Inc. (Nasdaq: PDFS) and Synopsys, Inc., today announced that they are working together to achieve a new level of designer productivity for yield optimization. The two companies have combined their expertise in design and manufacturing to extend Synopsys' widely used Liberty(TM) library format for cell-based yield rated data. This data is compatible with PDF Solutions' .pdfm format and pDfx(TM) process-aware design for manufacturability (DFM) environment, based on PDF Solutions' learning from more than 25 yield ramps and its yield simulation technology. Galaxy(TM) IC Compiler, the next-generation physical design solution from Synopsys, reads yield data through Liberty library format, letting Synopsys and PDF Solutions' mutual customers achieve faster time-to-results and better quality-of-results, optimizing concurrently for timing, area and power, as well as yield.

"The combination of PDF Solutions' yield models with the Synopsys next-generation physical design system is a natural fit," stated Kevin MacLean, vice president of DFM at PDF Solutions. "For years, we have used our Characterization Vehicle(TM) infrastructure to accurately model and improve our customers' processes. Wherever we can use our yield models to produce higher yielding designs, we help our customers even further. Using pDfx compatible yield optimization within Synopsys IC Compiler's XPS -- extended physical synthesis -- technology delivers a new level of designer productivity for yield optimization."

At 90 nm and below, interactions between design and process become the dominant yield-loss mechanisms. Designers must increasingly consider yield as a cost function that must be optimized alongside the traditional metrics of area, timing and power. Yield can be optimized during the routing stage by applying special techniques to interconnect, as well as during the physical synthesis stage by appropriate selection of library cells. Synopsys is extending Liberty library format to include cell-specific yield ratings that are compatible with PDF's yield models. Given a cell library with .pdfm yield data, IC Compiler is able to concurrently optimize for area, timing, power and yield, all in a single pass.

"Our leading-edge customers have come to depend on top-of-the-line interconnect yield optimizations provided in our routing technology," said Saleem Haider, senior director of marketing for physical design tools at Synopsys. "Working with PDF Solutions, we are now expanding this support into physical synthesis. By enabling concurrent optimization in IC Compiler, we are providing the top-of-the-line infrastructure necessary for considering yield as well as area, timing and power during the cell selection process."

About PDF Solutions

PDF Solutions, Inc. (Nasdaq: PDFS) is the leading provider of process-design integration technologies to enhance IC manufacturability. PDF Solutions' software, methodologies, and services enable semiconductor companies to create IC designs that are more manufacturable, and manufacturing processes that are more capable. By simulating nanometer-scale product and process interactions, PDF Solutions offers customers faster time-to-market, increased IC yield and performance, and improved product reliability and profitability. Headquartered in San Jose, Calif., PDF Solutions operates worldwide. For more information, visit www.pdf.com.

PDF Solutions is a registered trademark, and pDfx and "pDfx Compliant" are trademarks, of PDF Solutions, Inc.

Synopsys is a registered trademark of Synopsys, Inc. Liberty and Galaxy are trademarks of Synopsys. All other trademarks or registered trademarks mentioned in this release are the intellectual property of their respective owners.



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