EL SEGUNDO, Calif. – Sept. 28, 2016 -- A new white paper highlighting the use of NI AWR Design Environment for successful characterization of RF integrated circuits (RFICs) is now available at ni.com/awr. The white paper discusses various electromagnetic (EM) simulation techniques and their relative strengths and weaknesses when addressing the challenges of RFIC design.
The Integrating EM Simulation Technologies Within an RFIC Design Flow white paper can be downloaded (requires registration) at awrcorp.com/resource-library/integrating-em-simulation-technologies-within-rfic-design-flow.
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