Atrenta Introduces Early PPA Analysis at ARM TechCon 2011

(BUSINESS WIRE) — October 24, 2011 — Atrenta:

What:
Using ARM's AMBA® Designer and its SpyGlass® and GenSys® product families, Atrenta will demonstrate how to perform Early PPA analysis on AMBA-based designs.

When:
Tuesday, October 25, 2011

Where:
ARM TechCon 2011, Santa Clara Convention Center, Santa Clara, CA. Table #19

Why:
Defining the correct interconnect architecture for complex system on chip (SoC) designs can be challenging, requiring multiple back-end iterations. Early PPA analysis can reduce these iterations by helping to answer questions about the design up-front, such as:

1. What is the performance, power and area of the SoC being planned (PPA)?

2. Can “what-if” analysis be quickly performed to zoom-in on a high-confidence architecture?

3. Can I capture architectural intent, validate it and provide forward guidance for implementation?

Notes:

Atrenta, SpyGlass, GenSys and the Atrenta logo are registered trademarks of Atrenta Inc. All others are the property of their respective holders.

This press advisory contains forward-looking statements. Atrenta disclaims any obligation and does not undertake to update or revise the forward-looking statements in this press advisory.



Contact:

Corporate:
Atrenta
Tiffany Sparks, +1-408-467-4280
Email Contact
or
PR Agency:
Lee PR
+1-650-363-0142
Email Contact




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