(BUSINESS WIRE) — October 24, 2011 — Atrenta:
Using ARM's AMBA® Designer and its SpyGlass® and GenSys® product families, Atrenta will demonstrate how to perform Early PPA analysis on AMBA-based designs.
Tuesday, October 25, 2011
ARM TechCon 2011, Santa Clara Convention Center, Santa Clara, CA. Table #19
Defining the correct interconnect architecture for complex system on chip (SoC) designs can be challenging, requiring multiple back-end iterations. Early PPA analysis can reduce these iterations by helping to answer questions about the design up-front, such as:
1. What is the performance, power and area of the SoC being planned (PPA)?
2. Can “what-if” analysis be quickly performed to zoom-in on a high-confidence architecture?
3. Can I capture architectural intent, validate it and provide forward guidance for implementation?
- For information about the ARM TechCon 2011, visit: http://events.ubm.com/event/1153/the-arm-technology-conference
Atrenta, SpyGlass, GenSys and the Atrenta logo are registered trademarks of Atrenta Inc. All others are the property of their respective holders.
This press advisory contains forward-looking statements. Atrenta disclaims any obligation and does not undertake to update or revise the forward-looking statements in this press advisory.