Reminder to Register: Synopsys' Test SIG Event, Nov. 1, Austin, TX

Reminder to Register!
Synopsys' Test SIG Event

 

Date: Monday, November 1, 2010
Time: 6:45 p.m. - 9:30 p.m.

Austin Hilton Hotel  
Salon A & B, 4th Floor
Austin, TX 78701


The Synopsys 18th Annual Test SIG Event is next week! Register Now and join us for appetizers and cocktails, followed by a sit-down dinner. Test experts from leading companies will present how they are deploying Synopsys' synthesis-based test and yield analysis solution to address their most challenging requirements, including test and repair of embedded memories, test of designs with complex clocking schemes, power-aware test and volume diagnostics for rapid yield learning. 

Robert Aitken of ARM will host the following guest speakers at the 2010 Test SIG event:
  • Amitava Majumdar, AMD
  • Chris Ryan, Maxim Integrated Products
  • Kun Young Chung, Samsung Electronics
  • Florent Garait, ST-Ericsson

After the presentations, we will have prize drawings for a few Apple iPads, followed by coffee, dessert and conversation with Synopsys R&D staff in an informal setting.

Registration for this popular event is filling up quickly.   Register Now to request a reservation while there is still space available.




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