Reminder to Register!
Date: Monday, November 1, 2010
Time: 6:45 p.m. - 9:30 p.m.
Austin Hilton Hotel
Salon A & B, 4th Floor
Austin, TX 78701
The Synopsys 18th Annual Test SIG Event is next week! Register Now and join us for appetizers and cocktails, followed by a sit-down dinner. Test experts from leading companies will present how they are deploying Synopsys' synthesis-based test and yield analysis solution to address their most challenging requirements, including test and repair of embedded memories, test of designs with complex clocking schemes, power-aware test and volume diagnostics for rapid yield learning.
Robert Aitken of ARM will host the following guest speakers at the 2010 Test SIG event:
After the presentations, we will have prize drawings for a few Apple iPads, followed by coffee, dessert and conversation with Synopsys R&D staff in an informal setting.