New White Paper on Integrating EM Simulation Technologies Within an RFIC Design Flow Now Available

EL SEGUNDO, Calif. – Sept. 28, 2016 --  A new white paper highlighting the use of NI AWR Design Environment for successful characterization of RF integrated circuits (RFICs) is now available at The white paper discusses various electromagnetic (EM) simulation techniques and their relative strengths and weaknesses when addressing the challenges of RFIC design.


The Integrating EM Simulation Technologies Within an RFIC Design Flow white paper can be downloaded (requires registration) at




AWR, AWR Design Environment, National Instruments, NI and are trademarks of National Instruments. Other product and company names listed are trademarks or trade names of their respective companies.


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