Aug 31, 2016 - The process monitor provides the means for advanced node Integrated Circuit (IC) developers to detect the process variation of low-leakage 16nm core digital MOS devices. The Process Monitor can be used to enable a continuous Dynamic Voltage & Frequency Scaling (DVFS) optimisation system, monitor manufacturing variations on and if required, across chip, gate delay measurements, critical path analysis, critical voltage analysis and also monitor silicon ‘ageing’.
Moortec believes that in-chip monitoring has become a vital factor in the design and performance optimisation of small-geometry designs. Since 2010 Moortec have specialised in the development and delivery of highly featured embedded Process, Voltage and Temperature (PVT) sensors for or use in-chip within advanced node CMOS technologies such as 28nm and 16nm.
Using such monitors embedded within SoC (System on Chip) designs allows for greater dynamic performance optimisation as sensing die temperature, detecting logic speed and monitoring voltage supply levels can be used intelligently to vary system clock frequencies and the voltage levels of supply domains.
A key aspect is that optimisation can be applied to each and every device, either during production or when devices are 'in-the-field'. Moortec also believes that strategies adopted by IC designers over the coming years will be heavily influenced through the analysis of data harvested from in-chip monitors during the life time of every device.
"The increasing process variability that is apparent at these challenging small geometry CMOS technologies is forcing the IC design community to look at conditions in-chip, not just generally but also per device and within regions of a device," said Stephen Crosher, Managing Director of Moortec.
“The industry faces the challenge posed by demand for increasingly integrated, increasingly functional, giga-scale ICs for applications such as personal mobile technology and multi-core server configurations, whilst trying to improve battery life and maintaining optimal performance. Our easy-to-integrate process monitors are well placed to enable optimisation schemes to be used within the designs."
An AMBA APB interface is also available and provides a standard bus interface for a single instance of the process monitor.
Established in 2005, Moortec provide in-chip monitors and sensors, such as embedded Process Monitors (P), Voltage Monitors (V) and Temperature Sensors (T). Moortec’s PVT monitoring IP products enhance the performance and reliability of today’s Integrated Circuit (silicon chip) designs. Having a track record of delivery to tier-1 semiconductor and product companies, Moortec provide a quick and efficient path to market for customer products and innovations.
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