Advantest Introduces New Image-Processing Unit for Testing Advanced CMOS Image Sensors on Industry-Leading T2000 Platform

TOKYO, JAPAN -- (Marketwired) -- Nov 25, 2013 -- Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) (NYSE: ATE) has launched its new T2000 ISS IPE2 unit, significantly shortening the image-processing time needed to test the larger pixel sizes of today's advanced CMOS image sensors used in smart phones, tablet computers, digital cameras and video camcorders. Reducing test cycle times results in a lower cost per device, which helps to make the end-user electronic products more cost competitive.

Advantest's newest test module for its T2000 platform features an improved image-processing engine with a quad-core CPU. By incorporating four microprocessing cores, the flexible ISS IPE2 unit can assign an independent image-processing engine for each device undergoing simultaneous testing. This configuration can reduce test times by as much as 46 percent for high-end CMOS image sensors with higher pixel counts.

"Our new high-speed image-processing unit is designed to address the trend toward bigger pixels and higher image quality among CMOS image sensors," said Satoru Nagumo, executive vice president of Advantest Corporation. "This system addresses a pressing industry need that exists today and which we expect to extend well into the future."

Advantest is now shipping the new T2000 ISS IPE2 unit to customers worldwide.

About Advantest Corporation
A world-class technology company, Advantest is the leading producer of automatic test equipment (ATE) for the semiconductor industry and a premier manufacturer of measuring instruments used in the design and production of electronic instruments and systems. Its leading-edge systems and products are integrated into the most advanced semiconductor production lines in the world. The company also focuses on R&D for emerging markets that benefit from advancements in nanotech and terahertz technologies, and has introduced multi-vision metrology scanning electron microscopes essential to photomask manufacturing, as well as a groundbreaking 3D imaging and analysis tool. Founded in Tokyo in 1954, Advantest established its first subsidiary in 1982, in the USA, and now has subsidiaries worldwide. More information is available at

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