Atrenta to Present Quality Metrics for Synthesizable IP at Semico IMPACT Conference

SAN JOSE, Calif. — (BUSINESS WIRE) — November 4, 2013 — Atrenta:

What:
An Algorithmic, Objective Quality Metric for Synthesizable IP

When:
Date: Wednesday, November 6, 2013
Time: 3:50 p.m. – 4:15 p.m.
Location: Semico IMPACT Conference, Doubletree Hotel, San Jose, CA

Who:
Michael Johnson – Manager of Customer Solutions Delivery, Atrenta Inc.

Why:
The use of heterogeneous IP is on the rise for all SoC designs. More of this IP is now soft or synthesizable as well. Since soft IP has many possible implementation configurations, the task of validating the quality and completeness of this form of design data is daunting.

Deficiencies in areas such as routability, testability or power consumption can cause substantial tape out delays. In their worst form, these problems can cause the entire SoC project to fail.

In this presentation, we will explore a comprehensive IP quality auditing system developed by Atrenta to address this issue. Using the Atrenta IP Kit, IP consumers can substantially reduce IP reuse problems and have a much better view of the integration risks for any soft IP block.

Details about the conference track:

http://semico.com/content/constellations-track

About Atrenta

Atrenta’s SpyGlass Predictive Analyzer® significantly improves design efficiency for the world’s leading semiconductor and consumer electronics companies. Patented solutions provide early design insight into the demanding performance, power and area requirements of the complex system on chips (SoCs) fueling today’s consumer electronics revolution. More than two hundred companies and thousands of design engineers worldwide rely on SpyGlass to reduce risk and cost before traditional EDA tools are deployed. And with the addition of BugScope™ verification efficiency is also enhanced, allowing engineers and managers to find the fastest and least expensive path to silicon for complex SoCs.

SpyGlass from Atrenta: Insight. Efficiency. Confidence. www.atrenta.com

© 2013 Atrenta Inc. All rights reserved. Atrenta, the Atrenta logo, SpyGlass and SpyGlass Predictive Analyzer are registered trademarks and BugScope is a trademark of Atrenta Inc. All others are the property of their respective holders.

This media advisory contains forward-looking statements. Atrenta disclaims any obligation and does not undertake to update or revise the forward-looking statements in this media advisory.



Contact:

Atrenta:
Charu Puri, +1-408-453-3333
Email Contact
or
PR Agency:
Lee PR
+1-650-363-0142
Email Contact




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