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Title : Characterizing the Imrnunity of Integrated Circuits against Electrical Fast Transient Disturbances
Company : austriamicrosystems USA, Inc.
Date : 01-Nov-2006
Downloads : 8

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The constant growth of microelectronic components in our modern electronic systems makes great demands on the electromagnetic compatibility (EMC) of the integrated circuits (ICs). To determine the electromagnetic compatibility of ICs the IEC (International Electrotechnical Commission) is just working on two new standards to characterize their electromagnetic emission and their susceptibility. Unfortunately, the current version of the susceptibly standard does not include measurement methods to characterize the susceptibility of ICs to electrical fast transient (EFT) disturbances. In this paper a new measurement method, which was developed especially for this kind of characterization is introduced.
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