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Title : Using Boundary Scan to Link Design and Manufacturing Test
Company : Asset Intertech, Inc.
Date : 29-Oct-2006
Downloads : 10

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Featured Paper By Raymond J. Balzer,Adam W. Ley

In recent years, many in the electronics test industry have begun to realize that the value of boundary-scan test technology can be leveraged across the various phases in a product's life cycle. In particular, boundary scan can provide a link between design test and manufacturing test, producing long-term benefits in terms of greater efficiency and higher quality products. Such a link between design and manufacturing test will enable the benefits of standardizing and re-using design verification tests and PLD programming algorithms in manufacturing.
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