In the September 2005 issue of IEEE Transactions on Device and Materials Reliability, the article entitled The Rosetta Experiment: Atmospheric Soft Error Rate Testing in Differing Technology FPGAs [Ref 1] described real-time experiments that evaluated large Xilinx FPGAs fabricated in two CMOS technologies (150 nm and 130 nm) for their sensitivity to radiation-induced, single-event upsets and detailed the results from simulation, beam testing, and atmospheric testing. These results were compared to circuit simulation (QCRIT) studies as well as to LANSCE neutron beam results.
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Editorial
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