There are a number of metrics used to quantify the performance of an electronics manufacturing line. The generally accepted metrics are:
Process Quality
Usually expressed in defects per million defect opportunities (DPMO)
Process Uptime
What percentage of the available production time was the process line available for producing product?
Units produced per a particular time period
This metric is usually called product cycle time and is also referred to as line velocity or pulse rate. Throughput is another term used to describe this metric.
First pass yield (FPY)
This is a measure of how many of the units produced pass all the appropriate testing (in-circuit and/or functional) the first time they are tested.
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Editorial
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DAC 2012 at San Francisco CA - Jun 3 - 7, 2012
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