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Title : Nonlinear modelling for Sub 65nm IC statistical analysis
Company : InfiniScale®
Date : 26-Aug-2011
Downloads : 1

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This paper addresses analog/RF IC verification. We present significant improvements for statistical analysis at a very early stage in the design phase. First a new IC performances black-box modelling approach is presented, and then illustrated with application on different 65nm IP designs and validated with comparison of mathematical models to spice simulations. Finally, a model-based statistical analysis is presented.
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