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Featured Paper by Peter H. Chen, Harrison Liu, Peter Pong, Jim Wang, K.C. Wu, and Alvin Chen This paper proposes a fast methodology for basic characterization (input cap, output cap, and static power characterization) of analog IPs. An improved graph approach is proposed to reduce the run time and keep the accuracy of the input/output cap characterization. An Automatic Circuit Classification (ACC) and Knowledge-Based (KB) methodology for static power characterization is disclosed, which decreases the amount of test benches required from some million strong to within hundreds.
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