Downloads -> Technical Papers -> Case Studies

Avio Aerospace Open iT, Inc. 320-Oct-2014
Burlington Resources Open iT, Inc. 020-Oct-2014
XJTAG boundary scan maximises performance of modular test platform XJTAG 525-Sep-2014
XJTAG cuts PCB debug and test time for nCipher XJTAG 125-Sep-2014
4G-mobile pioneer proves concepts quickly using XJTAG boundary scan XJTAG 019-Jan-2014
CST STUDIO SUITE and the EDA WOrkflow CST - Computer Simulation Technology 118-Apr-2013
Tanner’s L-Edit and T-Cells drive productivity and speed to market Tanner EDA 121-Jan-2013
A Pappajohn Company Construction Imaging Systems 401-Dec-2011
Cedar Valley Construction Construction Imaging Systems 101-Dec-2011
Crowder Construction Construction Imaging Systems 101-Dec-2011
EDALab chooses easy integration and flexibility with LM-X License Manager X-Formation 023-Sep-2011
Enventive Engineering Manufactures Customer Satisfaction with LM-X License Manager. X-Formation 123-Sep-2011
LM-X License Manager meets TLP Innovations’ needs of today and tomorrow X-Formation 223-Sep-2011
NISYS gives X-Formation’s LM-X License Manager the green light X-Formation 023-Sep-2011
CVRx MKS Inc. 020-Sep-2011
Fiserv MKS Inc. 020-Sep-2011
Swisslog MKS Inc. 020-Sep-2011
Nationwide Mobile License Plate Recognition System Mango DSP Inc 008-Sep-2011
Life Lessons In EMC Engineering TechDream, Inc. 306-Sep-2011
65nm Migration IN2FAB Technology 723-Aug-2011
90nm Migration IN2FAB Technology 623-Aug-2011
Benchmarking Functional Verification Test and Verification Solutions Limited 707-Aug-2011
Low Power Design – we need a system perspective! Test and Verification Solutions Limited 1207-Aug-2011
Testing Multicore Software Test and Verification Solutions Limited 407-Aug-2011
Data Channel Amp Gradient Design Automation Inc. 026-Jul-2011
Mobile Tranceiver Gradient Design Automation Inc. 426-Jul-2011
Carpetright Electronic Point of Sale Solution Fujitsu Microelectronics 121-Jul-2011
Imperial Tobacco Virtualised Server Platform Fujitsu Microelectronics 021-Jul-2011
Specsavers: Support and Maintenance of IT Infrastructures Fujitsu Microelectronics 021-Jul-2011
Electronic-System Level (ESL) EVE USA Inc. 703-Jul-2011
Processors EVE USA Inc. 803-Jul-2011
Wireless Platforms EVE USA Inc. 303-Jul-2011
Migrating to UVM: how and why! Test and Verification Solutions 528-Jun-2011
Testing Concurrent Software Test and Verification Solutions 028-Jun-2011
EarCheck (Medical) Sanmina-SCI Corporation. 108-May-2011
Playaway (Multimedia) Sanmina-SCI Corporation. 008-May-2011
3G Video Applications Enter a New Era Dialogic 106-May-2011
Bay Talkitec Combines SMS, 3G Mobile, and Video in New “Video Yellow Pages” Solution Dialogic 006-May-2011
Beijing MXTelecom Develops Cost-Effective CTI Applications with Dialogic® Products Dialogic 006-May-2011
CCMENA Develops Advanced Integrated IVR, CRM, and Contact Center for Thuraya Dialogic 006-May-2011
ESD Survey for Telecommunications Client DfR Solutions 106-May-2011
Characterization Platform Dexcel Electronics Designs Pvt. Ltd. 224-Apr-2011
Onboard(MIL Grade) Image Compression Dexcel Electronics Designs Pvt. Ltd. 024-Apr-2011
Radar Transmitter Control Electronics Dexcel Electronics Designs Pvt. Ltd. 124-Apr-2011
Safety Weapon Interlock System for Defense Dexcel Electronics Designs Pvt. Ltd. 2424-Apr-2011
Acme Cellular_062509.pdf Data I/O Corporation 021-Apr-2011
Development of ASIC for battery powered stylus Cosmic Circuits 203-Mar-2011
Development of Microphone Preamp Cosmic Circuits 003-Mar-2011
Designing solenoid lenses for electron beams Field Precision LLC 113-Nov-2010
Global Unichip Corporation Dassault Systèmes 1028-Oct-2010
Agilent Technologies, Inc. Protects $1 billion in revenue with ENOVIA materials compliance system Dassault Systèmes 027-Oct-2010
Advanced modeling methodology for SEU: soft errors application InfiniScale® 503-Mar-2010
Efficient model-based parametric yield optimization InfiniScale® 603-Mar-2010
Model-based methodology MEMS Sizing and performance optimization InfiniScale® 303-Mar-2010
Model-Based parametric DFY Low drop out (LDO) Optimization for performance and parametric Yield InfiniScale® 003-Mar-2010
Data When and Where You Need It: Burns & McDonnell Engineers Access Standards in the Field in Minutes IHS Inc. 113-Feb-2010
Total 57 links listed, not including links in sub-categories.
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