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Title : Accelerating Nanometer Yield Ramp with Yield Diagnostics
Company : Cadence Design Systems, Inc.
Date : 16-Aug-2006
Downloads : 30

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The entire electronics industry's economic structure is based on getting ever more complex silicon at ever lower prices. The problems in silicon yield ramp are seriously threatening this model. Yield ramp is taking longer with each successive process generation, while the cost of low yield grows. Given the current trends, remarkably most nanometer-scale ICs will not reach nominal yield in their lifetime.
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