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Title : Analysis of Random Resistive Faults and ATPG Effectiveness at RTL
Company : Atrenta
Date : 19-Sep-2013
Downloads : 45

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Traditional netlist-based DFT analysis runs into design rule violations during scan insertion in synthesis and needs RTL designers to modify the design for uncontrollable clocks and resets. Similarly, low fault coverage during ATPG results in designers having to modify RTL to improve observability and controllability causing many design iterations and schedule impact.
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