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Title : A Low Complexity Method for Detecting Configuration Upset in SRAM Based FPGAs
Company : Andraka Consulting Group Inc
Date : 18-Mar-2008
Downloads : 5

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Field Programmable Gate Arrays (FPGAs) have brought reasonably priced, high performance processing to applications that previously could not be done without expensive custom logic. This has opened the door to a variety of experiments that were previously too expensive to accomplish. The application of FPGAs to environments where upset is likely has been slower because of the high logic cost associated with mitigating upset. The concern over upset extends to the configuration program for the reconfigurable (SRAM based) FPGAs. Fortunately or unfortunately, the devices best suited to signal processing and the larger logic density devices tend to be the SRAM (Static Random Access Memory) based ones. The complexity of configuration integrity monitoring has hindered application of these devices in environments where upset is likely.
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