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Non-intrusive validation, test and debug technologies have been around since the emergence of boundary scan (IEEE 1149.1 JTAG) in the mid-1990s. Over the years since then, the imperatives dictating probe-less methodologies have multiplied significantly, spawning a trend toward embedding instrumentation in chips, on circuit boards and in systems. Now, the test and measurement industry faces new imperatives even more demanding than those that brought about the first wave of non-intrusive technologies late last century.
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