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Posts Tagged ‘2015 International Test Conference’

Andrew Kahng: Modeling the Future of Semiconductors (and Test)

Wednesday, September 30th, 2015


Andrew Kahng is Professor of CSE and ECE at UC San Diego, and former General Chair at DAC, ISQED, and ISPD. As such, he knows what people who attend conferences need to hear. Next week he’s taking that knowledge to IEEE’s International Test Conference in Anaheim, delivering a keynote entitled: Modeling the Future of Semiconductors (and Test).

The question is, why is test an afterthought in the keynote title when test is never an afterthought in the flow required to get from design to volume manufacturing? One good guess would be because the world still thinks test is an afterthought, evidenced loud and clear by the fact that a conference on test lives as a separate entity from DAC, ISQED, or ISPD.

But again, how can test represent a set of ideas and disciplines sufficiently disconnected from design to live in its own silo? The answer is, test is not disconnected from design, but it does rely on a completely separate set of skills than design.


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