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Posts Tagged ‘formal x-verification’

Exposing and Eliminating X-optimism Bugs in RTL

Thursday, December 3rd, 2015

X-optimism occurs when an unknown X value is incorrectly resolved to a known value in RTL simulation. Optimism issues can be difficult to detect and debug because the X is no longer visible once the optimism occurs. The functional issue may not show up at an output for many, many clock cycles after the optimism. X-optimism issues also show up in a gate-level netlist or FPGA-based prototypes, but debug is difficult due to limited visibility in FPGAs, and netlist designs are less familiar post-synthesis. Trying to find an X-optimism bug in an FPGA model is like looking for a needle in a haystack due to limited visibility. In netlist simulations the design hierarchy is flattened, signal names changed, and there is a danger that the X under consideration will be mistaken for a pessimistic node and forced to a known value that hides a functional issue.

Real Intent’s Ascent XV uses static analysis to identify potential X-optimism issues at RTL so they can be fixed prior to simulation, ensuring efficient and accurate simulations. Fixing optimism issues in RTL streamlines getting netlist simulations or FPGA-based prototypes, up and running faster and reduces costly iterations. (more…)

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