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Bob Smith, Executive Director
Bob Smith, Executive Director
Bob Smith is Executive Director of the Electronic System Design Alliance, formerly the EDA Consortium. He is responsible for the management and operations of the ESD Alliance, an international association of companies providing goods and services throughout the semiconductor design ecosystem. … More »

Andrzej Strojwas Recipient of the Phil Kaufman Award

 
October 5th, 2016 by Bob Smith, Executive Director

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Many thanks to Peggy Aycinena whose blog post is found above mine for her great profile of this year’s Phil Kaufman Award recipient, Andrzej Strojwas (pronounced Andrey Stroyvas), Keithley professor of Electrical and Computer Engineering at Carnegie Mellon University. If you haven’t read it as yet, I highly recommend it.

Andrzej is being recognized with the award, presented annually by the ESD Alliance and the IEEE Council on Electronic Design Automation (CEDA), for his pioneering research in the area of design for manufacturing (DFM) in the semiconductor industry. The relationship between design and manufacturing has never been more important and Andrzej deserves praise for recognizing early on that DFM needed to be a key element of chip design automation. His work was instrumental in bringing design and manufacturing together in a way that has benefited the semiconductor design and manufacturing communities as well as the broader electronics products markets.

The Phil Kaufman Award Ceremony and Dinner to honor him will be held January 26 at the Fourth Street Summit Center in San Jose, Calif., where we held last year’s dinner paying tribute to Mentor Graphics’ Wally Rhines. Wally was honored for growing the EDA and IC design industries through his efforts as a leading voice of EDA and for pioneering the evolution of IC design to SoC design.

Industry luminaries applaud Andrzej’s accomplishments. Here are a few quotes from the news release:

“Virtually every fab in the world, as well as a vast majority of chips manufactured today, use methodologies Dr. Strojwas developed. Since the 1970s, he has done as much as anyone to co-optimize IC design and manufacturing, driving the more sophisticated use of design data in fabs.”

Dr. Larry Pileggi, the Tanoto professor of Electrical and Computer Engineering at Carnegie Mellon University

“At CMU, Dr. Strojwas and his colleagues Wojciech Maly and Stephen Director realized that semiconductor yield involves more than controlling contamination in a fab. It is also a consequence of design decisions. This insight led to the observation that yield influencers could be modeled, and that yield could be predicted by building a set of systematic test structures and analyzing the results. This systematic approach in many ways has enabled the fabless semiconductor ecosystem.”

Rob Aitken, R&D fellow at ARM, Inc.

“Dr. Strojwas’ contributions to improving and streamlining fabrication in the 1990s cannot be overstated. Deciding which wafers to inspect and where on the wafer to look were significant decisions. Dr. Strojwas developed a novel methodology using product layout design information to determine critical area-based sampling, reducing the amount of inspection time required and making in-line inspection affordable and effective. All major semiconductor fabs today employ these methods.”

Rick Wallace, CEO of KLA-Tencor

“Dr. Strojwas was instrumental in enabling this (the doubling of yield learning rates) by using statistically accurate test chips and simulation for rapid yield learning. His contributions have become industry standards in yield improvement.”

John Kibarian, CEO of PDF Solutions, Inc., and co-chair of the ESD Alliance

“Dr. Strojwas has published his research work extensively, including three books, more than 80 journal papers, and nearly 250 conference papers. He has successfully transformed his research into developing ULSIC designs with superior manufacturability as well as diagnosing manufacturing process issues that continuously improve line yield for these chips.”

Shishpal S. Rawat, president of CEDA

“Andrzej has been more effective in transferring university EDA research to industry than nearly all other academics. The result is an exemplary four-decade long career that has significantly advanced the art and science of design for manufacturability.”

John Chen, vice president at NVIDIA Corporation

“Dr. Strojwas’ ‘Design for Inspection’ methodology allows us to ‘detect the undetectables,’ allowing the industry to achieve the perfection required to cost effectively manufacture today’s chips containing billions of transistors and tens of billions of contacts and vias.”

Dr. Chenming Hu, TSMC distinguished professor emeritus at the University of California at Berkeley, and the 2013 Phil Kaufman Award recipient

Biographical Sketch of Dr. Andrzej J. Strojwas

Andrzej J. Strojwas is the Joseph F. and Nancy Keithley Professor of Electrical and Computer Engineering at Carnegie Mellon University. Since 1997, he has served as Chief Technologist at PDF Solutions and previously held positions at Harris Semiconductor Co., AT&T Bell Laboratories, Texas Instruments, NEC, HITACHI, SEMATECH and KLA-Tencor.

He received multiple awards for the best papers published in the IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on Semiconductor Manufacturing and IEEE-ACM Design Automation Conference. Dr. Strojwas is a recipient of the SRC Inventor Recognition Award. He was the Editor of the IEEE Transactions on CAD of ICAS from 1987 to 1989 and served as Technical Program Chairman of the 1988 ICCAD and Conference Chairman of the 1989 ICCAD. In 1990, he was elected IEEE Fellow.

Dr. Strojwas received a Master of Science degree in Electrical Engineering from the Technical University of Warsaw, Poland, and his Ph.D. from Carnegie Mellon University in Pittsburgh.

A note about the Phil Kaufman Award

The Phil Kaufman Award was established in 1994 as a tribute to Phil Kaufman, the late industry pioneer who turned innovative technologies into commercial businesses. It honors individuals who have had demonstrable impact on the field of EDA through technology innovations, education/mentoring, or business or industry leadership.

We hope you will be able to join us in celebrating Andrzej Strojwas and his mighty accomplishments. Registration for the Phil Kaufman Award Dinner will be available shortly at: www.esd-alliance.org

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