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Ed Lee
Ed Lee
Ed Lee has been around EDA since before it was called EDA. He cut his teeth doing Public Relations with Valid, Cadence, Mentor, ECAD, VLSI, AMI and a host of others. And he has introduced more than three dozen EDA startups, ranging from the first commercial IP company to the latest statistical … More »

S parameters have to be accurate…does in-situ de-embedding work?

 
March 10th, 2015 by Ed Lee

Screen shot 2015-03-10 at 11.37.44 AMIf you’re a board engineer, are you encountering high-speed issues? What are they?

One that’s garnering some thinking and observer attention is signal integrity for high(er) speed board designs.

With most all designs running at 10 Gbps (more mainstream these days), and approaching 25 Gbps, current measurement and verification of S-parameters seems to be an increasing concern.

At DesignCon, SI authority Erig Bogatin and Industry observer Max Maxfield discussed different aspects of this problem with AtaiTec CEO Ching-Chao Huang.

Bogatin says that causality is the way the real world works: a response can’t come before its stimulus arrives. All real-world measurements must obey causality, but some S-parameter measurements seem to violate it. An S-parameter behavioral model with a causality problem, used in a circuit simulation, usually results in a prediction that is non-physical and just plain wrong.

Maxfield says that engineers face problems when creating S-parameters from simulation and/or real-world measurements. Accurate simulations require accurate data for material properties, while measurement requires accurate de-embedding. The current state-of-play is that signal integrity (SI) engineers cannot easily correlate simulation and measurement results at 20 Gbps and above.

How accurate is your S-parameter process?

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